"I have been an SPIP™ Image Metrology user since 2003 and quickly became a fan for all of its capabilities including more advanced functionality like particle analysis and force curves that were ...

Metallurgy is vital to the industry for developing and making products from metals, composites, alloys, and other metal-related materials. Usually, product development and quality control processes ...

The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nanometer resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Park AFM-IR combines nanoscale infrared ...

The majority of semiconductor devices are made up of heterostructures, which are stacked layers of distinctive materials deposited by utilizing distinctive methods. These layers have a thickness in ...

HORIBA Jobin Yvon launches the new series of LabRAM Raman microscopes HORIBA Jobin Yvon the world leaders in Raman spectroscopy has announced the launch of its new series of LabRAM Raman microscopes ...

Novel developments also focus on quick and high-speed AFM to improve temporal resolution. 2 The combination of AFM with optical microscopy has expanded the number of possible applications, ...

An intelligent AFM processing framework integrates optimized scanning trajectories, distortion correction, and deep learning segmentation to improve imaging stability, accuracy, and automation. By ...

A collaboration team of researchers from the Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, the Institute of Transformative Bio-Molecules (WPI-ITbM), Graduate School of Science at ...