Automatic test pattern generation automatic test pattern generator is an electronic design automation method used to find an input sequence that, when applied to a digital circuit, enables automatic ...

BALTIMORE–At the International Test Conference here today, Synopsys Inc. announced new advanced test modeling technology that will more than triple the capacity of the company's design-for-test ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...

Mountain View, Calif.—Synopsys Inc. announced availability of its TetraMAX small delay defect automatic test pattern generator (ATPG) for use by design organizations worldwide to improve the quality ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...

CRTs don’t last forever, and neither do the electronics that drive them. When you have a screen starting to go wonky, then you need a way to troubleshoot which is at fault. A great tool for that is a ...