The integrations needed to determine beam deflections require the enforcement of the appropriate displacement and rotation boundary conditions (BCs). It is important that we be able to recognize these ...
In recent decades, the preparation of samples for transmission electron microscopes has transformed, thanks to the introduction of focused ion beam (FIB) instruments. Known as either single-beam or ...
Inverse problems in Euler–Bernoulli beam dynamics focus on determining unknown parameters or source distributions within the governing beam equation from external observations. This area spans the ...
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