A series of new tests highlights the benefits of using an abrasive-loaded gel to clean probe tips. Production wafer-level test is used to evaluate the performance of all manufactured ICs prior to ...

Researchers have looked at how hydrogen-induced contact resistance could help to reduce changes in series resistance, in either TOPCon or PERC solar cells. They said degradation occurs purely at the n ...

Contact resistance, or CRES, is one of those problems that most engineers prefer not to think about until it’s staring them in the face. For years, it could be managed quietly with routine probe card ...

Switch-contact bounce is an unavoidable mechanical phenomenon and complicates the task of measuring contact resistance; this circuit uses a current source and classic analog peak-detector circuit to ...

So you have power circuit breakers at your facility, and they seem to be just fine, sitting there quietly doing their job. What you may not realize is that even though your circuit breakers are ...

In the first part of this series on the highs and lows of resistance measurements, I discussed the basic principles for making two- and 4-wire resistance measurements for measuring resistances of less ...

As countries around the world strive to reduce their carbon footprints and seek sustainable energy resources, the solar energy industry has experienced significant growth. Among the diverse process ...

In 2024, the market share for n-type cell technology surpassed that for p-type cells for the first time, with p-PERC cells quickly exiting the stage. N-TOPCon cells have emerged as the mainstream ...