I recently surveyed the on-site development of the control system for a large concentrated solar power station. This “first of a kind” facility offered many control challenges, such as balancing heat ...

Jon Herlocker, co-founder and CEO of Tignis, sat down with Semiconductor Engineering to talk about how AI in advanced process control reduces equipment variability and corrects for process drift. What ...

Overlay control based on DI metrology of optical targets has been the primary basis for run-to-run process control for many years. In previous work we described a scenario where optical overlay ...

Just over a decade ago, an article titled, "Advanced Control Strategies Move into the Field" (Control, October 2008), highlighted three evolving trends in the process control world that would "make ...

A new kind of large language model, developed by researchers at the Allen Institute for AI (Ai2), makes it possible to control how training data is used even after a model has been built.