KLA leverages cutting-edge semiconductor inspection tech, partnering with industry leaders like TSMC and Samsung. This positions them to capitalize on the growing demand for 2nm and 3nm chip ...

Onto Innovation’s latest inspection advances have resulted in multiple orders from a top 3 OSAT and a top 3 image sensor manufacturer WILMINGTON, Mass.--(BUSINESS WIRE)-- Onto Innovation Inc. (NYSE: ...

A new technical paper titled “Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS” was published by researchers at KU Leuven, imec, Ghent University, and ...

insights from industryDr. Thomas FriesFounder and CEOFRT GmbH In this article, AZoM, talks to Dr. Thomas Fries, Founder and CEO of FRT GmbH, about the applications of both defect inspection and ...

WEINHEIM, Germany—Quality, it turns out, is about perspective. The right perspectives highlight your strengths and illuminate areas for improvement. And when it comes to your products, seeing them ...

Portable 3D optical inspection with 4Di InSpec transforms surface metrology, enhancing defect detection and quality assurance ...

KLA's defect inspection and metrology equipment are essential for economically manufacturing advanced chips. The company returns value to investors through dividends and highly accretive share ...

On the 24th of last month at the inspection room of Shinhadaiamond Industry’s first factory in Namdong-gu, Incheon, 12 workers peered through 50x microscopes at 4-inch (about 10 cm) discs. Their task ...

Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...

In addition to surface and subsurface defects, residual stress represents a concern. Over time, these stress points, ...