Experts at the Table: Semiconductor Engineering sat down to discuss the rapidly changing landscape of design for testability (DFT), focusing on the impact of advancements in fault models, high-speed ...

A technical paper titled “Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation” was published by researchers at University of Florida. “Scan-based ...

With wavering support for electric-vehicle (EV) subsidies in some jurisdictions as well as fierce competition, improving manufacturability of EVs is a critical responsibility of electronic design ...

Value in design prototyping using FPGAs. Validating the design with firmware. How the process works. Identifying companies with the right experience and expertise in FPGA and design prototyping ...