A focused ion beam scanning electron microscope (FIB-SEM) equipped with a compact time-of-flight secondary ion mass spectrometer (ToF-SIMS) 1,2 and traditional energy dispersive X-ray spectroscopy ...

In this interview, AZoM speaks to Dr. Dean Miller, Senior Scientist at TESCAN Group, about how plasma FIB-SEM can be used to accelerate multi-modal materials characterization. FIB-SEM is based on a ...

In this interview, we speak to Martin Slama at TESCAN, who describes sample preparation using high current plasma FIB SEM. Can you describe what high current plasma FIB-SEM is? The high current plasma ...