Ground Fault Circuit Interrupter outlets quietly guard the most dangerous spots in your home, cutting power in a fraction of ...
Test point selection and fault diagnosis remain critical challenges in the analysis and maintenance of analog systems. As these systems operate with continuous-valued signals and are susceptible to ...
A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” was published by researchers at Purdue University. “Chip aging may result in ...
The new Fisher Pierce® TPM Series Test Point Mounted Fault Indicator from Thomas & Betts helps workers locate faulted circuits in underground distribution systems quickly. The new Fisher Pierce® TPM ...
ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.
Early results of using device-aware testing on alternative memories show expanded test coverage, but this is just the start. Once the semiconductor industry realized that it was suffering from device ...