Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...