(a) and (b) Optical microscope images depicting the sample with defects and the defect-free sample. (c) and (d) Experimentally measured optical field distributions for the sample with defects and the ...

Phase-Shifting Interferometry (PSI) techniques have become fundamental in optical metrology for accurately measuring surface topographies and reconstructing three‐dimensional profiles. By generating ...

Phase retrieval constitutes a pivotal challenge in disciplines ranging from optics and materials science to signal processing, where the objective is to reconstruct a signal’s phase from ...