Semiconductor process engineers would love to develop successful process recipes without the guesswork of repeated wafer testing. Unfortunately, developing a successful process can’t be done without ...

The semiconductor industry has always faced challenges caused by device scaling, architecture evolution, and process complexity and integration. These challenges are coupled with a need to provide new ...

Author Dr. R. Russell Rhinehart discusses his new book, Nonlinear Model-Based Control: Using First-Principles Models in Process Control, and explains why nonlinear first-principles models should be ...

Process mining is now part of Microsoft’s process automation suite, giving you the KPIs and visualizations you need to identify bottlenecks in both manual workflows and software processes. Automating ...

Previous chapters have addressed fracture geometry, physical and geomechanical properties of single fractures, fracture detection, and the interpretation of hydraulic and tracer tests. All of these ...