Citation: Shear, B. R., Whitfield, E., & Nath, K. (2025). Investigating the relationship between sample size and reliability of aggregate test score measures in Colorado schools. Boulder, CO: The ...

KAWASAKI, Japan--(BUSINESS WIRE)--Toshiba Electronic Devices & Storage Corporation (“Toshiba”) has developed "X5M007E120," a bare die [1] 1200V silicon carbide (SiC) MOSFET for automotive traction ...

Undaunted by the skyrocketing costs of new semiconductor fabs and the formidable hurdles facing the industry with each new technology node, leading IC manufacturers are continuing to strive for ...