In certain instances, direct access to a structure being studied may not be possible due to mechanical constraints, such as device packaging or limitations related to the samples themselves. To ...

A new technical paper titled “Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology” was published by researchers at Samsung. “We propose an ultra-wide-field ...

This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry. The format of the workshop includes an introduction, fundamentals of ellipsometric ...

Optical characterisation of thin films is a critical field that bridges fundamental research and application in materials science and engineering. It encompasses the use of various spectroscopic ...

Alfred University is recipient of a National Science Foundation (NSF) grant of nearly $350,000, which will be used to acquire equipment that will enhance multi-disciplinary research and education ...