A focused ion beam scanning electron microscope (FIB-SEM) featuring a compact Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS) and a traditional microanalytical method of Energy Dispersive ...

Stephan, T., Rost, D., Vicenzi, Edward P., Bullock, Emma S., MacPherson, Glenn J., Westphal, A. J., Snead, C. J., Flynn, G. J., Sandford, S. A., and Zolensky, M. E ...