The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...

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Techniques that reduce the difficulty and cost associated with testing an integrated circuit. This can result in a decrease in the time spent on a tester, a decrease in cost associated with generating ...

Oscilloscopes (i.e., scopes) are one of the primary tools in a test and measurement toolbox. This TechXchange collects articles and videos about using and selecting scopes. Part of the challenge of ...

To ensure customers receive high-quality products, engineers must consider testing strategies before they even think about a schematic diagram. These days, most engineers realize boundary scan ...

Connected devices and systems have become an integral part of our everyday life and we take this for granted. Finding the fastest way to our destination with a smartphone, reading the news on a tablet ...