The Sarnoff Digital Test Pattern When I was approached about evaluating the Sarnoff Digital Test Pattern, my interest was piqued immediately. After all, it's been a long time since most of us have ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

This page provides information regarding a spatial point pattern test I developed as part of my PhD Dissertation. This is a point pattern test that measures the degree of similarity at the local level ...