a, Schematics of a conventional spectroscopic ellipsometry system. b, Schematics of a metasurface array-based single-shot spectroscopic ellipsometry system. The metasurface array-based system for ...

(Nanowerk News) Two-dimensional (2D) material flakes consist of single to few atomic layers, granting them extraordinary quantum properties, which are not observed in everyday materials. As a result, ...

Spectroscopic ellipsometry based on photoelastic modulation delivers very high accuracy and repeatability. Owing to this technology the UVISEL allows the unique combination of high performance and ...

Ellipsometry is a technique used to characterize optical properties and thicknesses of thin films by measuring the change in polarization state of light reflected from the surface of (or through) a ...

QD-UKI are are celebrating 21 years of Spectroscopic Ellipsometry workshops with their partners, J A Woollam. This free of charge workshop is aimed at both experienced ellipsometry users as well as ...

The technique of analyzing & measuring the characteristics of the film in a non-destructive and non-contact manner is known as ellipsometry. The device which is used for this purpose is called as an ...