Focused ion beam (FIB) milling is a nanofabrication technique that uses ... Future advancements in FIB milling will focus on improving the resolution, throughput, and versatility of the technique. The ...

[Andrew] has been busy running a class on hardware reverse engineering this semester, and figured a great end for the class would be something extraordinarily challenging and amazingly powerful.

equipped with SuperX-EDS detector FEI Single Tilt Holder FEI Double Tilt Holder FEI Double Tilt Low-background EDS Holder Gatan 626 Cryo Holder Gatan High Field-of-view Single-tilt Tomography Holder ...

The HZDR team is utilizing its Institute of Ion Beam Physics and Materials Research ... Donor spin qubits, the focus of this project, offer greater stability against environmental perturbations ...

The microscope is equipped with Gallium - Focused Ion Beam (FIB) for 3D EM imaging. It features a large chamber (330 mm inner diameter, 270 mm height) with 18 configurable ports for optional ...