Researchers at INL, part of the Diéguez group and led by Sara Abalde-Cela, have engineered a plasmonic substrate that ...

SPIPTM TM version 6.7 enables easy and robust particle analysis in SEM and SPM images, thanks to the new and enhanced detection and splitting options. Using the new Circle Detection method, SPIPTM 6.7 ...

With the onset of the 4th industrial revolution, artificial intelligence has recently been utilized in smartphone cameras, providing functions such as auto-focusing, face recognition, and 100x zoom, ...

Devices and objects produced from fibers are being increasingly used in everyday life. Fibers are generally imaged in a scanning electron microscope (SEM), which provides elemental analysis, ...

Tabletop SEMs, particularly the TM4000 Series, revolutionize electron microscopy by offering high-resolution imaging and user ...

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

These are SEM images of carbon nanotubes CNTs. Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use ...

CD-SEM, the workhorse metrology tool used by fabs for process control, is facing big challenges at 5nm and below. Traditionally, CD-SEM imaging has relied on a limited number of image frames for ...