With the onset of the 4th industrial revolution, artificial intelligence has recently been utilized in smartphone cameras, providing functions such as auto-focusing, face recognition, and 100x zoom, ...

SPIPTM TM version 6.7 enables easy and robust particle analysis in SEM and SPM images, thanks to the new and enhanced detection and splitting options. Using the new Circle Detection method, SPIPTM 6.7 ...

Devices and objects produced from fibers are being increasingly used in everyday life. Fibers are generally imaged in a scanning electron microscope (SEM), which provides elemental analysis, ...

The SEM Visualization Engine (SEM-VE) combines a 16 bit scan generator and dual super-sampling signal acquisition hardware with image processing and control software for your Zeiss electron microscope ...

With the onset of the 4th industrial revolution, artificial intelligence has recently been utilized in smartphone cameras, providing functions such as auto-focusing, face recognition, and 100x zoom, ...

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

These are SEM images of carbon nanotubes CNTs. Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use ...

Prepare for a remarkable journey into magnificent magnification with "Nanocosmos: Journeys in Electron Space" (Abrams Books, ...

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