Abstract: Optical Distance Measurement (ODM) systems have a wide range of applications in many sectors, including industrial, aerospace, and telecommunication. It is essential in systems where ...
Abstract: In this work, time-dependent gate reliability studies were carried out on GaN high-electron-mobilitytransistors (HEMTs) under continuous DC gate bias ($\mathrm{V}_{\mathrm{GS}}$) and ...
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