Abstract: This article reports the time-dependent dielectric breakdown (TDDB) reliability of zirconia (ZrO2)-based MIM capacitors with sub-0.7-nm equivalent oxide thicknesses (EOT). Results indicate ...

AUSTIN (KXAN) — Just as we were enjoying the effects of a cold front, temperatures are slowly on the rise and lack of rainfall continues… until Friday when we get a lot of rain at once. Tonight, ...