Abstract: This article reports the time-dependent dielectric breakdown (TDDB) reliability of zirconia (ZrO2)-based MIM capacitors with sub-0.7-nm equivalent oxide thicknesses (EOT). Results indicate ...
Abstract: A protocol for the characterization of thin conducting films (TCSs) by means of terahertz time-domain spectroscopy (THz-TDS) is thoroughly presented. By employing a Gires-Tournoisétalon ...
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