Abstract: Semiconductor manufacturing requires highly precise defect detection to ensure product quality and yield. This paper presents a deep learning-based defect detection framework using Faster ...

Purposes: To develop a combined model integrating multi-channel deep learning features, radiomics features, and clinical variables for noninvasive pathological grading of clear cell renal cell ...

Abstract: Flood mapping using remote sensing data is critical to disaster response, especially in real-time monitoring and edge deployment. However, existing deep-learning (DL) models often face ...