IEEE

Comparative Analysis of Wafer Defect Segmentation Based on Image Processing with U-Net++

Abstract: This study addresses the problem of automated defect detection and segmentation on semiconductor wafer surfaces to support quality control in real manufacturing environments. The main ...
IEEE

Research on Micro-Defect Image Enhancement Technology by Integrating Zero-Shot ...

Abstract: This paper proposes an innovative scheme for micro-defect image enhancement that integrates Zero-Shot SuperResolution and OpenCV technologies. Zero-Shot SuperResolution enables ...