Discover how researchers achieved high-resolution atomic-scale images using low-cost electron microscopes, transforming ...

More than 97% of electron microscope images aren’t reported in peer-reviewed scientific papers, according to a large-scale ...

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

Semplor, a leading provider of innovative tabletop SEM solutions, and Digital Surf, renowned for its advanced surface imaging ...

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...