MAPLE GROVE, Minn., Dec. 17, 2018 /PRNewswire/ -- ZEISS Industrial Quality Solutions announces the new, affordable SPECTRUM bridge-type coordinate measuring machine (CMM) line. Using the latest ZEISS ...
MAPLE GROVE, Minn., Dec. 17, 2018 /CNW/ -- ZEISS Industrial Quality Solutions announces the new, affordable SPECTRUM bridge-type coordinate measuring machine (CMM) line. Using the latest ZEISS ...
MAPLE GROVE, Minn., Oct. 26, 2015 /PRNewswire/ — ZEISS Industrial Metrology today announced the introduction of the new DuraMax LTE coordinate measuring machine (CMM), providing uncompromising access ...
The decision to add a high-speed-scanning CMM should be based largely on what it does, not how much it costs. The decision to add a high-speed-scanning CMM should be based largely on what it does, not ...
MAPLE GROVE, Minn., Oct. 1, 2019 /CNW/ -- The Quality Show will provide an opportunity for ZEISS Industrial Quality Solutions to look back at 100 years of company history, thanking its customers for ...
WHITE PLAINS, N.Y., April 22, 2025 /PRNewswire/ -- ZEISS announces the introduction of its highly flexible and efficient software suite, ZEN core, for operating all ZEISS scanning electron microscopes ...
WHITE PLAINS, N.Y., April 22, 2025 /CNW/ -- ZEISS announces the introduction of its highly flexible and efficient software suite, ZEN core, for operating all ZEISS scanning electron microscopes (SEMs) ...
CAPTURE 3D makes the fast digitalization of very large parts possible with the ZEISS ATOS LRX accurate 3D scanner engineered for fields such as heavy casting, shipbuilding, aerospace structures, ...
Zeiss has announced the launch of its Laser Scanning Module 'Zeiss LSM DuoScan', designed to radically expand the frontiers in live cell imaging. The module adds a second laser scanner to the LSM 510 ...
With Airyscan, ZEISS introduced a new detector concept for confocal laser-scanning microscopy (LSM). Whereas traditional LSM designs use a combination of pinhole and single-point detectors, Airyscan ...
ZEISS introduces its new field emission scanning electron microscope (FE-SEM) ZEISS GeminiSEM 450. The instrument combines ultrahigh resolution imaging with the capability to perform advanced ...
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